Beedie School of Business > Ideas@Beedie > SFU Beedie Professors receive top altmetric score for article featured in Oxford Journals

SFU Beedie Professors receive top altmetric score for article featured in Oxford Journals

Nov 22, 2017

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SFU Beedie professors, Karen Ruckman and Ian McCarthy, are among the recipients of the top altmetric score by Oxford Journals for their article on why some patents get licensed while others do not.

Click here to view the full collection of articles in Industrial and Corporate Change that had the most impact and influence in 2017.

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